"Scanning Probe Microscopy-Physical Property Characterization at Nanoscale" ed. by Vijay Nalladega
InTeO | 2012 | ISBN: 9535105760 9789535105763 | 253 pages | PDF | 20 MB
This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, to oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films.